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120nm resolution in thick samples with structured illumination and adaptive optics

机译:具有结构照明和自适应光学器件的厚样品中的120nm分辨率

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Linear Structured Illumination Microscopy (SIM) provides a two-fold increase over the diffraction limited resolution. SIM produces excellent images with 120nm resolution in tissue culture cells in two and three dimensions. For SIM to work correctly, the point spread function (PSF) and optical transfer function (OTF) must be known, and, ideally, should be unaberrated. When imaging through thick samples, aberrations will be introduced into the optical system which will reduce the peak intensity and increase the width of the PSF. This will lead to reduced resolution and artifacts in SIM images. Adaptive optics can be used to correct the optical wavefront restoring the PSF to its unaberrated state, and AO has been used in several types of fluorescence microscopy. We demonstrate that AO can be used with SIM to achieve 120nm resolution through 25 μm of tissue by imaging through the full thickness of an adult C. elegans roundworm. The aberrations can be corrected over a 25μm × 45μm field of view with one wavefront correction setting, demonstrating that AO can be used effectively with widefield superresolution techniques.
机译:线性结构照明显微镜(SIM)比衍射极限分辨率提高了两倍。 SIM在二维和三维组织培养细胞中产生120nm分辨率的出色图像。为了使SIM正常工作,必须知道点扩散函数(PSF)和光学传递函数(OTF),并且理想情况下,不要对它们进行校正。通过厚样品成像时,像差将引入光学系统,这将降低峰值强度并增加PSF的宽度。这将导致分辨率降低和SIM卡图像中的伪影。自适应光学器件可用于将PSF恢复到其未畸变状态,以校正光波前,并且AO已用于多种类型的荧光显微镜中。我们证明,可以通过成年秀丽隐杆线虫full虫的整个厚度成像,将AO与SIM一起使用,以通过25μm的组织达到120nm的分辨率。可以通过一种波前校正设置在25μm×45μm的视场上校正像差,这表明AO可以有效地用于宽场超分辨率技术。

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