State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China;
State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China;
State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China;
State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China;
State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, China;
Silicon; Electric potential; Electrostatics; Electron traps; Performance evaluation; Photonic band gap; Chemicals;
机译:<![CDATA [CDATA [第一原理研究LA
机译:<![cdata [srco的缺陷化学和传输属性
机译:<![CDTA [CDTA [CE:INF PLACE =“POST”> 0.6 CE:INF> SR
机译:SiO
机译:安全困境的逻辑:INF条约谈判的言语行为分析。
机译:室温下电子辐照在金属氧化物/ Si界面上形成无定形SiO2;在界面上写入电子束
机译:电子和空穴诱捕在SiO