首页> 外文会议> >A Method for Optimum Test Point Selection and Fault Diagnosis Strategy for BIT of Avionic System
【24h】

A Method for Optimum Test Point Selection and Fault Diagnosis Strategy for BIT of Avionic System

机译:航空电子系统BIT最佳测试点选择与故障诊断策略

获取原文

摘要

A method for optimum test point selection and the fault diagnosis strategy which is based on the fault message matrix and features of BIT is proposed. The fault message matrix is divided based on the weight of the test points The diagnosis strategy is determined using dividing the fault message matrix and the thought of detecting first and isolating next. Result shows that the optimum method is suitable for BIT to select the appropriate test points and fault diagnosis procedure. Besides, average numbers of test steps were reduced.
机译:提出了一种基于故障信息矩阵和BIT特征的最优测试点选择方法和故障诊断策略。根据测试点的权重划分故障消息矩阵。使用故障消息矩阵划分和首先检测然后隔离的思想来确定诊断策略。结果表明,该最优方法适合BIT选择合适的测试点和故障诊断程序。此外,减少了平均测试步骤。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号