Performance Test of Digital Chip Based on LK8810 Platform

摘要

In recent years, integrated circuit industry has become the core and pillar of China’s information industry. Integrated circuit is a technology intensive industry with a long industrial chain, which mainly includes four links: integrated circuit design, chip manufacturing, chip packaging and chip testing. With the rapid development of integrated circuit technology, the degree of chip integration is getting higher and higher. High integrated digital chips need higher requirements of test technology, in order to improve the test accuracy and help the chip qualification detection. Based on LK8810 integrated circuit tester, taking SN74LS08 digital chip as an example, this paper tests the digital chip from three aspects: open and short circuit test, function test and parameter test, makes a comprehensive research on the chip performance, and analyzes the functional characteristics and key parameters of the chip. In the implementation of the test, the hardware and software joint debugging is carried out from the aspects of hardware circuit design and implementation, software test combination optimization, and finally the chip test results are displayed by the upper computer of the platform. After strict comparison and analysis with the example digital chip data manual, as well as comprehensive analysis and exploration, the results show that the test effectively improves the accuracy of digital chip test. The digital chip test scheme is simple and feasible, accurate and intuitive, which is suitable for the test of various digital chip functions and parameters.