首页>
外文会议>International Test Conference
>Statistical and System Approaches For Jitter, Noise, And Bit Error Rate (BER) Tests For High Speed Serial Links And Devices
【24h】
Statistical and System Approaches For Jitter, Noise, And Bit Error Rate (BER) Tests For High Speed Serial Links And Devices
We have introduced a systematical method for dealing with jitter, noise, and BER (JNB) from combined statistical and system frequency response perspectives. We first introduced necessary statistical basics such as probability distribution function (PDF) and cumulative distribution (CDF), as well system frequency response such as jitter transfer functions. Then we introduced approaches for combining those two important elements to form a complete and accurate JNB testing method and setup for a serial link. With all the necessary theorems and methods introduced, we illustrated how to apply them in solving JNB testing problems for both system and its components for PCI Express and similar link standards such as FB DIMM and SATA
展开▼