Peltier based Temperature Controller for MOS Dosimeter Characterization

摘要

Temperature variations can reduce accuracy in the radiation measurements of MOS dosimeters, so it is necessary to have an accurate temperature characterization of the dosimeter. This paper presents a temperature control system based on Peltier modules that enables automated temperature adjustment of the device under test (DUT). At first, the design and features of the system is presented. In a second part, measurements of some characteristics of the device are shown. Finally, the zero temperature coefficient (ZTC) of a MOS radiation dosimeter is measured to show the controller application.