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Applying TMR in Hardware Accelerators Generated by High-Level Synthesis Design Flow for Mitigating Multiple Bit Upsets in SRAM-Based FPGAs

机译:应用TMR在高级合成设计流中产生的硬件加速器中,以减轻基于SRAM的FPGA中的多个位UPSET

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This paper investigates the use of Triple Modular Redundancy (TMR) in hardware accelerators designs described in C programming language and synthesized by High Level Synthesis (HLS). A setup composed of a soft-core processor and a matrix multiplication design protected by TMR and embedded into an SRAM-based FPGA was analyzed under accumulated bit-flips in its configuration memory bits. Different configurations using single and multiple input and output workload data streams were tested. Results show that by using a coarse grain TMR with triplicated inputs, voters, and outputs, it is possible to reach 95% of reliability by accumulating up to 61 bit-flips and 99% of reliability by accumulating up to 17 bit-flips in the configuration memory bits. These numbers imply in a Mean Time Between Failure (MTBF) of the coarse grain TMR at ground level from 50% to 70% higher than the MTBF of the unhardened version for the same reliability confidence.
机译:本文研究了在C编程语言中描述的硬件加速器设计中使用三重模块化冗余(TMR),并通过高级合成(HLS)合成。在其配置存储器位中的累积比特翻转下分析由软核处理器和由TMR保护并嵌入基于SRAM的FPGA的矩阵乘法设计的设置。测试了使用单个输入和多个输入和输出工作负载数据流的不同配置。结果表明,通过使用具有三次输入,选民和输出的粗粒TMR,可以通过累积高达61位翻转和99%的可靠性来达到95%的可靠性通过累积高达17位翻转配置内存位。这些数字暗示在粗粒TMR的故障(MTBF)之间的平均时间,从地面的50%到70%,高于消费品的MTBF,用于相同的可靠性信心。

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