Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects

摘要

TMR is the most widely used technique to increase the reliability of SRAM-based FPGAs used in safety-critical applications. In this paper we evaluate experimentally the realistic effectiveness of several TMR schemes implemented with different levels of granularity. We measure and compare the dynamic cross-section of the TMRd circuits as well as number of accumulated bit-flips that cause a functional error. Additionally, we analyze and evaluate the effectiveness of both partial and full reconfiguration in both coarse and fine grained TMR schemes. As experimental results demonstrate, coarse-grained TMR efficiency and efficacy may be higher than a fine-grained TMR when partial reconfiguration is available.