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Dependence of asperity depth on secondary electron emission coefficient

机译:粗糙度深度对二次电子发射系数的依赖性

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Surface discharges at the solar array on the spacecrafts are originated from electrification. Now, estimation of the electrical potential of the spacecraft by electrification is carried out. But, the reliability of the calculated results depends on the accuracy of the physical properties. One of the desired property is the secondary electron emission coefficient (SEEC): δ (The number of secondary electrons/Primary electrons). In this study, SEEC was obtained down to 200 eV using the original irradiation system. In the preliminary experiment using the Au sample, the magnitude of the maximum δ was 1.6 which was obtained around the primary electron energy Ep≈800 e V. It is reported that roughness on surface materials by atomic oxygen (AO) in the low earth orbit increase remarkably. Thus, the authors tried to make asperity forming island structures by evaporating Au. AFM (Atomic Force Microscope) was used for observing the surface geometry. The result showed that the height of several tens nanometers was able to be controlled. The magnitude of SEEC of evaporated sample increased compared with the untreatment sample.
机译:航天器上的太阳能阵列的表面排出源自电气化。现在,执行通过电气化估计航天器的电位。但是,计算结果的可靠性取决于物理性质的准确性。其中一个特性是二次电子发射系数(SEEC):δ(二次电子/主电子的数量)。在本研究中,使用原始辐照系统将SEEC降至200eV。在使用Au样品的初步实验中,围绕初级电子能源E P ≈800eV的最大δ的大小为1.6。据报道,原子氧对表面材料的粗糙度(Ao)在低地轨道上显着增加。因此,作者试图通过蒸发Au来制造胰岛素结构。 AFM(原子力显微镜)用于观察表面几何形状。结果表明,能够控制几十纳米的高度。与未处理样品相比,蒸发样品的SEC的幅度增加。

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