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Method for measuring secondary electron emission coefficient

机译:测量二次电子发射系数的方法

摘要

Problem to be solved: to provide a method of measuring a secondary electron emission coefficient of high accuracy.Scanning electron microscope and scanning electron microscopeFirst collection boardThe second collection board andFirst current meterSecond current meterVoltmeterFaraday cupIncludingInjection current I enter the Faraday cup I first step to measure the injection current andThe first and second collection plates are short circuitedPlace the measurement sample between the first collection plate and the second collection plateA positive voltage of 50 volts is applied between the measurement sample and the first collection plateA second step to acquire the current iother of electrons other than secondary electrons andThe first and second collection plates are short circuitedA positive voltage is applied between the first collection plate and the measurement sampleA third step of obtaining the current ISS formed by secondary electrons andThe ratio of IE and I injection current is calculated.Secondary electron emission coefficient δ .Diagram
机译:要解决的问题:提供一种测量高精度的二次电子发射系数的方法。扫描电子显微镜和扫描电子显微镜光学精力集团第二集收集板和渠道热门MEDIONED电流METERMOTERFARADAY CUNINCLUDINGINING电流I进入FARADAY CUP I进入测量喷射电流,第一和第二系列板在第一系列之间的测量样品短路测量样品。在测量样品和第一收集平台第二步骤之间施加50伏的第二收集透压块正电压,以获取二次电子以外的电流的电流,并且第一和第二收集板是短的循环正电压在第一系列之间施加了短电压计算由二次电子形成的电流和IE和I喷射电流的比率获得电流的第三步骤。相信的电子发射系数δ.diagram

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