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Kernel Density Estimation for Post Recognition Score Analysis

机译:后识别分数分析的内核密度估计

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Post processing pattern recognition results has long been an effective way to reduce the false recognitions by rejecting results that are deemed wrong by a verification system. Recent work laid down a theoretical foundation for a specific post recognition approach. This approach was termed Meta Recognition by its inventors and is based on a statistical outlier detection that makes use of the Weibull distribution. Using distance or similarity scores that are generated at recognition time, Meta Recognition automatically classifies a recognition result to be correct or incorrect. In this paper we present a novel approach to Meta Recognition using a kernel density estimation. We show this approach to be able to outperform the aforementioned post processing technique in different scenarios.
机译:后处理模式识别结果长期以来一直是通过拒绝被验证系统被认为错误的结果来减少虚假识别的有效方法。最近的工作为特定的后识别方法奠定了理论基础。这种方法被发明者称为META识别,并且基于利用Weibull分布的统计异常检测。使用在识别时间生成的距离或相似度分数,元识别会自动对识别结果进行正确或不正确分类。在本文中,我们使用内核密度估计提出了一种新的元识别方法。我们展示了这种方法能够在不同场景中优于上述后处理技术。

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