X-ray mirror development and testing for the ATHENA mission

摘要

This study reports development and testing of coatings on silicon pore optics (SPO) substrates including pre and post coating characterisation of the x-ray mirrors using Atomic Force Microscopy (AFM) and X-ray reflectometry (XRR) performed at the 8 keV X-ray facility at DTU Space and with synchrotron radiation in the laboratory of PTB at BESSY II. We report our findings on surface roughness and coating reflectivity of Ir/B_4C coatings considering the grazing incidence angles and energies of ATHENA and long term stability of Ir/B_4C, Pt/B_4C, W/Si and W/B_4C coatings.