2O Ultra-thin <10nm) Dual-oxide (Al<inf>2</inf>O<inf>3</inf>/TiO<inf>2</inf>) Hybrid Device (Memory/Selector) with Extremely Low I<inf>off</inf> <1nA) and I<inf>reset</inf> <1nA) for 3D Storage Class Memory
首页> 外文会议>Symposium on VLSI Technology >Ultra-thin <10nm) Dual-oxide (Al2O3/TiO2) Hybrid Device (Memory/Selector) with Extremely Low Ioff <1nA) and Ireset <1nA) for 3D Storage Class Memory
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Ultra-thin <10nm) Dual-oxide (Al2O3/TiO2) Hybrid Device (Memory/Selector) with Extremely Low Ioff <1nA) and Ireset <1nA) for 3D Storage Class Memory

机译:超薄<10nm)双氧化物(Al 2 O 3 / TIO 2 )混合装置(存储器/选择器),非常低于I OFF <1NA)和I RESET <1NA)用于3D存储类存储器

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We demonstrate ultra-thin ALD-processed dual-oxide (Al2O3/TiO2) hybrid device with memory and selector characteristics by engineering the stability of metal filament in Al2O3 and TiO2 layer. The optimized hybrid memory device shows outstanding performances such as low off current , low reset current , and high on/off ratio . Inserting a Ti buffer layer which has a low electrode potential value, we observed excellent uniformity and retention property. Finally, an outstanding read/write margins and ultra-low power consumption are confirmed through array simulations of the proposed hybrid memory device.
机译:我们展示了超薄的ALD加工双氧化物(Al 2 O. 3 / TiO. 2 )用记忆和选择器特性的混合装置通过工程在Al中的金属丝的稳定性 2 O. 3 和tio. 2 层。优化的混合存储器件显示出出色的性能,例如低截止电流,低复位电流和高开/关比。插入具有低电极电位值的Ti缓冲层,我们观察到优异的均匀性和保留性能。最后,通过提出的混合存储器件的阵列模拟确认了出色的读/写边距和超低功耗。

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