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Rotationally asymmetric figure measurement of optical flat using rotational shear phase measuring deflectometry

机译:使用旋转剪切相位测量偏转测量光平的光平的旋转不对称图测量

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Absolute measurement with Phase Measuring Deflectometry (PMD) is gaining importance in industry, but the accuracy of deflectometry metrology is strongly influenced by the level of calibration. In order to improve the accuracy of the PMD to a level where it competes with interferometry, a reference calibration process is commonly carried out to carefully calibrate the systematic errors. The systematic errors obtained by measuring a high quality reference surface can be subtracted from the measurement of a test surface to get its actual surface, however, it could introduce the surface error of reference into the measurement. To alleviate this problem, this paper introduces a technique named "rotational shear phase measuring deflectometry", this technique have the ability of removing the rotationally asymmetric systematic errors from the test surface without using a reference surface. The validity of this technique has been demonstrated by simulation and our experimental results.
机译:具有相位测量偏转测量(PMD)的绝对测量在工业中越来越重要,但偏转测量测量的准确性受校准水平的强烈影响。为了提高PMD的准确性在与干涉测量法竞争的水平,通常进行参考校准过程以仔细校准系统误差。可以从测试表面的测量中减去通过测量高质量参考表面而获得的系统误差以获得其实际表面,但是,它可以将参考的表面误差引入测量。为了缓解这一问题,本文介绍了一种名为“旋转剪切相位测量偏转物”的技术,该技术具有在不使用参考表面的情况下从测试表面去除旋转不对称的系统误差的能力。通过模拟和实验结果证明了这种技术的有效性。

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