R D partnership for Future Power Electronics Technology 2-9-5 Toranomon, Minato-ku, Tokyo 105-0001, Japan,Advanced Power Electronics Research Center, National Institute of Advanced Industrial Science and Technology Central 2 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan;
R D partnership for Future Power Electronics Technology 2-9-5 Toranomon, Minato-ku, Tokyo 105-0001, Japan,Advanced Power Electronics Research Center, National Institute of Advanced Industrial Science and Technology Central 2 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan;
Advanced Power Electronics Research Center, National Institute of Advanced Industrial Science and Technology Central 2 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan;
Advanced Power Electronics Research Center, National Institute of Advanced Industrial Science and Technology Central 2 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan;
R D partnership for Future Power Electronics Technology 2-9-5 Toranomon, Minato-ku, Tokyo 105-0001, Japan,Advanced Power Electronics Research Center, National Institute of Advanced Industrial Science and Technology Central 2 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan;
机译:用于电气设备应用的低离角4H-SIC外延晶片的研究
机译:具有邻角的3英寸4H-SiC Si面外延晶片的生长
机译:用Klapper对邻域基体上4H-SiC同质外延的模型进行实验验证
机译:减少4H-SiC同性端的晶片OFF角度
机译:切角对晶片键合串联太阳能电池直接晶片键合的n-砷化镓/ n-砷化镓结构电导率的影响
机译:掺杂变化对4H-SiC晶片晶格畸变的影响
机译:Klapper对邻近基底4H-siC同质外延模型的实验验证