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Force Calibration of a Dual-Probe Nanotweezer Using a Mechanical Lever

机译:使用机械杆强制校准双探针纳米仪

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This paper presents a noncontact force calibration method in applications of the dual-probe nanotweezer. A 2 DOF mechanical lever has been developed to directly calibrate both the normal and lateral sensitivities of two optical levers used to independently measure normal and lateral forces applied on the nanotweezer. The mechanical lever is designed with a configuration of two mutually perpendicular levers, each consists of two flexible hinges, sharing a same rotational center, Each lever can convert the translation into a nanoscale rotation angle that provides an accurate conversion between the photodiode voltage output and deflective angle of a cantilever. During the calibration, a cantilever is mounted on the mechanical lever and attached on the rotational center of the flexible hinges. By making use of its nanomotion on the Z-axis and using an external motion on the barrier, this device can complete the local and full-range sensitivity calibrations of the optical levers without modifying the actual AFM or the cantilevers. Nonlinearities on both normal and lateral of the optical levers have been accurately compensated.
机译:本文介绍了双探针纳米仪应用中的非接触力校准方法。已经开发了2 DOF机械杆,直接校准两个光杆的正常和横向敏感性,用于独立测量施加在纳米仪上的正常和横向力。机械杆设计成具有两个相互垂直的杠杆的构造,每个杠杆由两个柔性铰链组成,共用相同的旋转中心,每个杠杆可以将平移转换为纳米级旋转角度,该沿纳米级旋转角度在光电二极管电压输出和偏转之间提供精确转换的纳米级旋转角度悬臂的角度。在校准期间,悬臂安装在机械杆上并连接在柔性铰链的旋转中心上。通过在Z轴上使用其纳米级并在屏障上使用外部运动,该装置可以完成光学杆的局部和全范围灵敏度校准,而无需修改实际的AFM或悬臂。在光杆的正常和横向上的非线性已经精确地补偿了。

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