Immunity Modeling of the LM2902 Operational Amplifier

摘要

Component models that predict functional failure are necessary for predicting the immunity of systems to electromagnetic interference (EMI). A method to extract these models using measurements on integrated circuits (ICs) already exists. This measurement method for ICs with single-ended connections is extended, to include ICs with differential connections. The LM2902 op-amp is measured and modeled as a first case study.