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Ga_2O_3 Alloys As Potential Transparent Conducting Oxides (TCO) Materials for CdTe Photovoltaics - a DFT Study

机译:Ga_2O_3合金作为CdTe Photovoltaics的潜在透明导电氧化物(TCO)材料 - DFT研究

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Thin film photovoltaic cells based on Cu (In, Ga) (S, Se)_2 and CdTe have achieved significantly improved power conversion efficiencies (~ 20%). These solar cells typically exhibit a layered structure with absorber material (CdTe) at the middle. Commercial CdTe solar cells incorporate a CdS buffer layer between the CdTe and transparent conducting oxide (TCO) layer to achieve high conversion efficiency. With advent of MgZnO (MZO), CdS buffer layer is not essential. Wide band gap of MZO ensures appropriate band offset at the TCO/absorber interface. A conduction band offset of ~ + 0.2 eV which is representative of a small spike across the TCO/CdTe interface is preferred to deter interface recombination. Mg content in MZO controls the band gap of MZO and allows easy tunability of the band offsets across MZO/CdTe interface. Despite these advantages, the MZO layers suffer from interface recombination due to unfavorable band offsets, and high interfacial defect density. These factors adversely affect the conversion efficiencies. The efficiency of CdTe solar cells is also limited by low V_(oc). Improving the front TCO/absorber interface is key to realize higher V_(oc) along with achieving required bulk carrier density and lifetime.
机译:基于Cu(In,Ga)(s,Se)_2和CdTe的薄膜光伏电池已经实现了显着提高的功率转化效率(〜20%)。这些太阳能电池通常在中间具有具有吸收剂材料(CDTE)的分层结构。商业CDTE太阳能电池在CDTE和透明导电氧化物(TCO)层之间包含CDS缓冲层,以实现高转化效率。随着MGZNO(MZO)的出现,CDS缓冲层不是必需的。 MZO的宽带隙确保了TCO /吸收器界面处的合适带偏移。 〜+ 0.2eV的导通带偏移是在TCO / CDTE接口上代表小尖峰的偏移是妨碍界面重组的。 MZO中的MG含量控制MZO的带隙,允许跨MZO / CDTE接口的带偏移的可调性。尽管存在这些优点,但MZO层由于不利的带偏移而遭受界面重组,并且具有高界面缺陷密度。这些因素对转化效率产生不利影响。 CdTe太阳能电池的效率也受到低V_(OC)的限制。改善前TCO /吸收器接口是实现更高V_(OC)的键,以及实现所需的散装载体密度和寿命。

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