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Estimation of bias in the oxidative induction time measurement by pressure DSC

机译:压力DSC氧化诱导时间测量偏差估计

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Oxidative induction time (OIT) is defined as the time to the onset of oxidation of a test specimen exposed to oxygen at an elevated isotermal test temperature. In the pressure differential scanning calorimetry embodiment of this test, the test specimen is often exposed to the oxidizing atmosphere as the apparatus is heated from ambient to the isothermal test temperature. This creates a bias in the measurement due to undetected oxidation on beating. An expression, based upon the Arrhenius equation, is derived and then numerically integrated to obtain and estimate of the bias introduced into the OIT measuremet. The bias is dependent on the activation energy of the reaction and on the heating rate. It is found to be less than 1.2 minute for the most common heating rates, and is less than 3 minutes for the most extreme sets of experimental conditions. The bias is small when compared to experimental repeatability of the OIT measurement and to the mean of OIT values. For this reason, it may be ignored in all but the most extreme cases of low activation energy, very slow heating rates, very low OIT values and high test temperatures.
机译:氧化诱导时间(OIT)定义为在升高的异形测试温度下暴露于氧气暴露于氧气的氧化的时间。在该试验的压差扫描量热法测定实施例中,试样通常暴露于氧化气氛,因为该装置从环境温度从环境中加热到等温测试温度。由于未检测到的跳动,这在测量中产生了偏差。基于Arrhenius方程的表达式被导出,然后在数上集成以获得和估计引入到OIT测量仪中的偏差。偏差取决于反应的激活能量和加热速率。对于最常见的加热速率,它被发现小于1.2分钟,并且对于最极端的实验条件,少于3分钟。与OIT测量的实验重复性和oIt值的平均值相比,偏差很小。因此,在最低激活能量的最极端情况下,可能忽略它的所有极端情况,加热速度非常缓慢,oit值非常低,测试温度高。

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