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XPS Characterization of Porphyrin Based Self-Assembled Monolayers on Gold

机译:XPS表征卟啉基于金的卟啉自组装单层

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XPS characterization of self-assembled monolayers (SAMs) of tetraphenylporphyrin bearing a rigid tripodal linker by chemisorption of the thiol-derivatized terminal groups on gold substrate is described. The surface structure of the SAMs bearing tripodal linker were analyzed by X-ray photoelectron spectroscopy (XPS), and electrochemical cyclic voltammetry (CV) measurements. XPS confirms the formation of porphyrin SAMs on Au surface and identified bonding configurations of porphyrin molecules in the chemisorption of SAMs. The film thickness values (36 ?) obtained by XPS agree well with the estimated value by assuming the vertical orientation of the molecules on the gold surface. Using the Au4f_(7/2) as an internal standard, a lower binding energies shift (1.8 eV) of S2p in the SAMs reveals that the porphyrins were chemisorbed onto the surface via sulfur-gold bonds. Electrochemical CV measurements suggest near monolayer coverage of the tripodal porphyrins with good stability of the redox SAMs, which have promising application in the development of molecular based electronic device and memory architectures.
机译:描述了通过化学吸附于金基质上的硫醇衍生化的末端基团的抗晶状体连接物的四苯基卟啉的自组装单层(SAMS)的XPS表征。通过X射线光电子能谱(XPS)分析了轴承三码头连接器的SAM的表面结构,以及电化学环伏安法(CV)测量。 XPS确认在Au表面上形成卟啉SAMS,并确定了SAM的化学吸附中卟啉分子的键合配置。通过假设金表面上的分子的垂直取向,通过XPS获得的膜厚度值(36≤)与估计值良好。使用AU4F_(7/2)作为内标,SAM中S2P的较低结合能量偏移(1.8eV)显示卟啉通过硫 - 金键将卟啉化学吸附到表面上。电化学CV测量建议在三码体卟啉的单层覆盖附近,具有良好的氧化还原SAMS的稳定性,在基于分子的电子设备和内存架构的开发中具有希望的应用。

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