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Apertureless Scanning Near-field Optical Microscopy Using Heterodyne Detection Method

机译:使用外差检测方法扫描近场光学显微镜的近距离扫描近场光学显微镜

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Heterodyne detection is most common technique in apertureless scattering near-field optical microscopy (A-SNOM), because it can get better signal-to-noise ration (S/N ratio) than the homodyne detection. Fore-researchers provided a rough way to express the heterodyne detection signals in order to avoid the complicated interference signal expressions. Therefore, the explanation is not clear and missing much information in signal processing. In this study, we analyze and verify the amplitude and phase of heterodyne detection signals in complete interference model which including the tip enhancement phenomena and tip reflective background electric field in different harmonics of tip vibration frequency. From our analytical results, we propose meaningful concepts: (1) the high order harmonic tip scattering noise decays faster with high order Bessel function in small phase modulation depth than the near-field interaction signal; (2) longer wavelength and smaller incident angle of incident electric field has better signal contrast, and it opposites traditional optical microscope about shorter wavelength has better resolution.
机译:外差检测是不可不动的散射近场光学显微镜(A-SNOM)的最常见技术,因为它可以获得比H​​omodyne检测更好的信号 - 噪声级(S / N比)。前研究人员提供了一种表达外差检测信号的粗略方式,以避免复杂的干扰信号表达式。因此,解释在信号处理中不明确且缺少许多信息。在该研究中,我们分析并验证完整干扰模型中的外差检测信号的幅度和相位,其包括尖端振动频率的不同谐波中的尖端增强现象和尖端反射背景电场。从我们的分析结果来看,我们提出了有意义的概念:(1)高阶谐波散射噪声衰减在小相位调制深度比近场相互作用信号中的高阶贝塞尔函数更快; (2)入射电场的较长波长和较小的入射角具有更好的信号对比度,并且它与传统的光学显微镜相对有关较短波长具有更好的分辨率。

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