Test generation for sequential networks affected by reconvergent fanout: a solution based on a 9-valued algebraic circuit model

摘要

Test generation for sequential networks affected by reconvergent fanout implies the simultaneous management of the good circuit and the faulty circuit. A theoretical approach to the solution of this problem, based on the definition of a 9 valued algebraic circuit model, is proposed. Results obtained on the set of ISCAS '89 circuits show the effectiveness of the technique.