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Radon Daughter Plate-out onto Teflon

机译:氡子女板块在teflon上

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摘要

Radiopure materials for detector components in rare event searches may be contaminated after manufacturing with long-lived ~(210)Pb produced by the decay of atmospheric radon. Charged radon daughters deposited on the surface or implanted in the bulk of detector materials have the potential to cause noticeable backgrounds within dark matter regions of interest. Understanding the mechanics governing these background signals is therefore a paramount concern in dark matter experiments in order to distinguish a real signal from internal detector backgrounds. Teflon (i.e. PTFE) is a specific material of interest because it makes up the walls of the inner detector of many liquid noble detectors such as the LUX-ZEPLIN experiment. The rate of radon daughter plate-out onto Teflon can be orders of magnitude larger than the plate-out rate onto other materials. Mitigation of plate-out onto Teflon and steel by proximity to other materials is demonstrated.
机译:在用大气氡衰减产生的长寿命〜(210)Pb制造后,罕见事件搜索中的检测器组件的放射材料可能被污染。沉积在表面上或植入大部分探测器材料的带电氡末端有可能在暗物质区域内引起明显的背景。理解管理这些背景信号的机制是暗物质实验中最重要的关切,以便区分来自内部探测器背景的实际信号。 Teflon(即PTFE)是一种特定的感兴趣的材料,因为它构成了许多液体贵宾检测器的内探测器的墙壁,例如Lux-zeplin实验。氡子子板的速率板在Teflon上可以是大于其他材料上的平板速率的数量级。通过邻近对其他材料进行说明,减轻了在Teflon和钢上的缩短。

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