Crystal Growth and X-ray Diffraction Characterization of Sb_2Te_3 Single Crystal

摘要

We report the single crystal growth and X-ray diffraction characterization of bulk Sb_2Te_3 single crystal. Single crystal of Sb_2Te_3 was grown by modified Bridgman method. The diffraction peaks corresponding to {0, 0, 3} planesreveal the growth of crystal along the c-direction.X-ray diffraction analysis by rietveld refinement confirms and verifies the phase purity, rhombohedral structure and single crystalline nature of the prepared Sb_2Te_3 crystal. Unit cell structure of Sb_2Te_3 consist of three quintuple layers stacked one above the other.