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Microstructural Change in Crystal Grains during Phase Transformation of Hf-Zr-O Ferroelectric Thin Films

机译:HF-ZR-O铁电薄膜相变期间晶粒的微观结构变化

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Phase transformation of Hf-Zr-O films with the annealing condition is investigated. It is shown that depending on the thermal budget applied to the Hf-Zr-O films, the transformation of crystal structures progresses in the order of the tetragonal phase, the orthorhombic phase, and finally the monoclinic phase. This trend is reflected on the emergence of ferroelectricity in Hf-Zr-O films. The stabilization of the metastable orthorhombic phase before transforming into the most stable monoclinic phase is discussed based on the mechanical stress caused by the volume change between crystal cells. Its evidence is demonstrated as the change of microstructure in the crystal grains.
机译:研究了HF-ZR-O膜随退火条件的相变。结果表明,取决于施加到HF-ZR-O膜的热预算,晶体结构的转化按四边形相,正交相的顺序进行,最后是单斜相。这种趋势反映在HF-ZR-O膜中铁电的出现。基于由晶体电池之间的体积变化引起的机械应力讨论在转化到最稳定的单斜相之前的亚稳态正晶相的稳定化。其证据被证明是晶粒中微观结构的变化。

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