Lensless Phase Difference Microscopy with Designed Imaging Device

摘要

In this paper, we propose a lensless phase difference microscopy (LPDM) using an imaging sensor with grating structure on the top of light-sensitive areas. Designing the period of grating appropriately, the proposed sensors can capture the intensity and phase difference information simultaneously using the contact imaging scheme. Benefitting from the scheme, the LPDM can achieve large space-bandwidth product with very low complexity and cost.