首页> 外文会议>IEEE Conference on Electrical Insulation and Dielectric Phenomenon >Effect of Temperature Changes on Tine Film Sacrificial Copper Strips due to Sulfur Corrosion
【24h】

Effect of Temperature Changes on Tine Film Sacrificial Copper Strips due to Sulfur Corrosion

机译:硫腐蚀引起的温度变化对齿膜牺牲铜条的影响

获取原文
获取外文期刊封面目录资料

摘要

This paper presents the characteristics of thin film copper strips due to sulfur corrosion at different temperatures. Thin film copper with a layer thickness of 200 nm was deposited onto a glass substrate using an electron beam evaporator. In order to enhance the adhesion of thin film copper on the glass substrate, titanium with a layer thickness of 5 nm was deposited prior to copper evaporation. Three dibenzyl disulfide (DBDS) concentrations were chosen to simulate the different levels of oil corrosiveness: (1) 100, (2) 250, and (3) 1000 ppm. The thin film copper strips were immersed in the corrosive oil samples and then aged in a forced convection laboratory oven at 120 and 130°C for 25 h. The copper loss due to sulfur corrosion was monitored by measuring the resistance of the thin film copper strips using the 4-wire measurement method. Based on the preliminary results, sulfur corrosion is accelerated by increasing the temperature from 120 to 130°C. The amount of copper losses from the glass substrate caused by the corrosive by-products due to the breakdown of DBDS is more pronounced at higher temperature, as evidenced from the measured resistance values.
机译:本文提出了由于不同温度的硫腐蚀引起的薄膜铜条的特性。使用电子束蒸发器将具有200nm的层厚度为200nm的薄膜铜。为了在玻璃基板上提高薄膜铜的粘附,在铜蒸发之前沉积具有5nm的层厚度为5nm的钛。选择三种二苄基二硫化物(DBDS)浓度以模拟不同水平的耐油腐蚀性:(1)100,(2)250和(3)1000ppm。将薄膜铜条浸入腐蚀性油样中,然后在120和130℃的强制对流实验室烘箱中老化25小时。通过使用4线测量方法测量薄膜铜带的电阻,监测引起的硫腐蚀引起的铜损。基于初步结果,通过将温度从120至130℃增加温度加速硫腐蚀。由于DBD的击穿引起的玻璃基板的铜损耗的量在较高温度下更明显,从测量的电阻值中证明。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号