Innovative Scattering Measurement System in W-Band

摘要

We present an innovative system dedicated to millimeter wave scattering measurements in W-band. The principal innovations are the high-precision swivel arm, use of a semi-anechoic environment, flexibility for positioning the object under study, and post-processing to correct measurement errors. Different test objects are used for evaluating the performance of the system for VV- and HH-polarizations.