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The measurement of wait time in non-productive process of process units — Chieh-yuan Tiao

机译:过程单位非生产过程中等待时间的测量 - Chieh-yuan Tiao

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摘要

Ever since 2007, time waste became an industry-wide topic. In 2011 [ITRS] - roadmap, waste reduction was introduced as an important topic for the requirement of future manufacturing. WTW (wait time waste) then became a formal project in ISMI. Fundamental definition and methodology was developed to systematically measure time consumption and expose time waste for a product during its factory life cycle.The ISMI developed WTW method mainly focus on wafer-based factory data collection, which convert continuous tool events along specific wafer into independent record for each wafer (Fig.1). However, certain non-productive activities (wafer-less clean, pre/post process chamber condition, ... ) which processed without wafer are frequently occurred in factory's daily operation. Without taking these non-productive process into consideration, miscalculation of wait time waste is expected. And in certain worse case, a conflict of measurement may take place in tools with unique non-productive process. By introducing an optimized wafer categorizing and time element definition methodology, the non-productive process can successfully be identified and measured. That will improve the accuracy of the calculation/estimation in time waste as well as material waste between productive and non-production ratio, and eliminate the possibility of conflict generating.generating.
机译:自2007年以来,时间浪费成为一个行业范围的话题。 2011年[ITRS] - 路线图,浪费减少作为未来制造要求的重要课题。 WTW(等待时间浪费)然后成为ISMI的正式项目。开发了基本的定义和方法,以系统地测量时间消耗并在工厂生命周期内为产品曝光时间浪费。ISMI开发了WTW方法主要关注基于晶圆的工厂数据收集,该数据收集将连续工具事件转换为特定晶圆的连续工具事件转换为独立记录对于每个晶片(图1)。然而,在工厂的日常操作中经常发生在没有晶片的情况下处理的某些非生产活动(晶圆清洁,预/后处理室条件,......)。不考虑这些非生产过程,预期等待时间浪费的错误分布。在某些情况下,可以在具有独特非生产过程的工具中进行测量冲突。通过引入优化的晶圆分类和时间元素定义方法,可以成功识别和测量非生产过程。这将提高时间浪费的计算/估计的准确性以及生产性和非生产率之间的材料浪费,并消除冲突产生的可能性。根本。

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