Defect Engineered Multi-Walled Carbon Nanotube arrays as Electrochemical Double Layer Capacitors

摘要

The efficacy of vertically aligned defect engineered multi-walled carbon nanotube (MWCNT) arrays as electrochemical double layer capacitors (EDLCs) was investigated using standard electrochemical techniques such as cyclic voltammetry (CV) and electrochemical impedance spectroscopy (EIS). We report a ～ 200% improvement in specific double layer capacitance of MWCNT arrays by extrinsically introducing defects using argon plasma irradiation. The capacitance-voltage characteristics of argon irradiated MWCNTs provide insights into the nature of the defects and their influence on the specific capacitance (capacitance/area).