Microstructure and dielectric properties of (Sr_(0.88)Bi_(0.08)) TiO_(3)-Bi(Mg_(1/2)Ti_(1/2))O_(3) ceramics

摘要

In the present study, (1-x)(Sr_(0.88)Bi_(0.08))TiO_(3)-xBi(Mg_(0.5)Ti_(0.5))O_(3) (SBT-BMT) system was synthesized using conventional solid state processing. X-ray diffraction (XRD) and SEM testings were employed to determine the phase constitution and microstructure of ceramics. SBT-BMT ceramics exhibited moderate dielectric permittivities ((epsilon)_(r)) (>1100 at RT) and low dielectric loss (0.07percent) over the temperature range from -20 to 200 deg C, with flat temperature coefficients of permittivity. In addition, SBT-BMT ceramics were observed to possess dielectric relaxation characteristics and energy densities, being on the order of 1.4 J/cm~(3) at 180 kV/cm was observed for the 0.8S_(0.88)B_(0.08)T-0.2BMT ceramics.