Application of Rietveld Method to the Structural Characteristics of some Bulk and Nanocrystalline Materials

摘要

In recent years, the full pattern structure refinement using Rietveld Method, with the advent of increased performance of powder diffractometers has allowed enormous progress in the analysis of powder diffraction data. In the full pattern structure refinement, with the possibility of varying peak shape parameters and site occupancies along with the structural and instrumental parameters, provides information not only on the crystal and magnetic structure, but also gives precise knowledge of the particle size and micro‐structural strain. In this report Rietveld profile refinement of some bulk and nano crystalline materials has been presented.