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Study of two-step electro less etched Si nanowire arrays

机译:两步电蚀刻Si纳米线阵列的研究

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The influence of the nucleation process of Ag particles on the formation of Si nanowire arrays is investigated by two-stage electroless chemical etching. The dimensions of the Ag particles formed in the first stage of the process play an important role in the formation of the Si nanowires. The nucleation and etch result are analysed using SEM. The electrical properties of the resulting Si NW arrays are also studied.
机译:通过两阶段化学蚀刻研究了Ag颗粒对Ag颗粒对Si纳米线阵列形成的影响。在该过程的第一阶段形成的Ag颗粒的尺寸在Si纳米线的形成中起重要作用。使用SEM分析成核和蚀刻结果。还研究了所得Si NW阵列的电性能。

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