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Production of Transparent heat windows of TiO2/Ag/TiO2, and investigation of their nanostructures

机译:生产TiO2 / Ag / TiO2的透明热窗,以及纳米结构的研究

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Using the resistive heated method, TiO2/Ag/TiO2 thin files (Transparent heat windows) in vertical deposition angle were deposited on SiO2 substrate, in high vacuum (HV) condition and 100°C. The thickness of TiO2 on glass substrate was 50°A, Silver film 125°A and 22S°A and the upper layer TiO2 with 115°A. All other deposition conditions were same for both samples. Atomic force microscope (AFM), and spectrophotometric methods were used to study the nanostructures of these samples in the range of FTIR. The purpose of this work is to find and produce the structure with the least energy waste.
机译:使用电阻加热方法,在高真空(HV)条件下沉积在SiO 2基板上的垂直沉积角度的TiO2 / Ag / TiO2薄文件(透明热窗),在高真空(HV)条件下和100℃。玻璃基板上的TiO 2的厚度为50°A,银膜125°A和22S°A和具有115°A的上层TiO 2。两个样品的所有其他沉积条件相同。原子力显微镜(AFM)和分光光度法用于研究这些样品在FTIR范围内的纳米结构。这项工作的目的是找到并产生最少的能量浪费的结构。

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