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Novel Circuit Technique for Reduction of Active Drain Current in Series/Parallel PMOS Transistors Stack

机译:用于减少串联/并联PMOS晶体管堆叠有源漏极电流的新型电路技术

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Stacking of MOS transistors [1] is used for minimization of standby current in Nano-scale CMOS circuits. Stacking of PMOS is preferred over NMOS because value of active drain current in PMOS is less than NMOS. It results because of mobility of holes in PMOS is less than mobility of electrons in NMOS [2]. In this paper we observed active drain current consumption by series/parallel combination of two and three PMOS transistors. This observation leads to propose the novel technique for reduction of active drain current in series/parallel PMOS assembly. The effect of V_(GS), V_(Ds), V_(SB) and intermediates node voltages is also addressed. The proposed circuit is simulated for TSMC 0.18 μm technology using Spice(c) simulator.
机译:堆叠MOS晶体管[1]用于最小化纳米级CMOS电路中的待机电流。 PMOS的堆叠优于NMOS,因为PMOS中的主动漏极电流值小于NMOS。它的结果是因为PMOS中的孔的迁移率小于NMOS中电子的迁移率[2]。在本文中,我们观察了两个和三个PMOS晶体管的串联/并联组合的主动漏极电流消耗。该观察导致提出了用于减少串联/并联PMOS组件中的有源漏极电流的新颖技术。还寻址V_(GS),V_(DS),V_(SB)和中间数据节点电压的影响。使用Spice(C)模拟器模拟TSMC0.18μm技术的提出的电路。

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