Research of anti-blooming array CCD image sensor

摘要

Based on the current array CCD image sensor technology, integration time of each pixel sensitive unit in the CCD image sensor was controlled independently by way of adding circuits for pixel sensitive unit addressing and integration pulse generating. The integration time of the pixel sensitive unit was shortened appropriately when charges overflowed potential well of pixel sensitive unit in the array CCD Image Sensor, thereby achieving the aim of anti-blooming. The method was simulated by MATLAB and can obtain an ideal effect.