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Quantitative modelling of resonant PL in InGaN SQW-LED structure

机译:IngaN SQW LED结构中谐振PL的定量建模

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The measurement of bias and temperature dependent photoluminescence, photocurrent and their decay times allows to deduce important physical properties such as barrier height, electron-hole overlap and the magnitude of the piezoelectric field in InGaN quantum wells. However the analysis of these experiments demands for a detailed physical model based on a realistic device structure which is able to predict the measured quantities. In this work a self-consistent model is presented based on a realistic description of the alloy and doping profile of a green InGaN single quantum well light emitting diode. The model succeeds in the quantitative prediction of the quantum confined Stark shift and the associated change in the electron-hole overlap measured via the change in the bimolecular decay rate using literature parameters for the piezoelectric constants. The blue shift of the emission under forward current conditions can be attributed to the carrier induced screening of the piezoelectric charges as predicted by the model.
机译:偏压和温度依赖性光致发光,光电流及其衰减时间的测量允许推导出诸如IngaN量子阱中的压电场的屏障高度,电子孔重叠和压电场的大小的重要物理性质。然而,对这些实验的分析需要基于现实设备结构的详细物理模型,其能够预测测量的数量。在这项工作中,基于绿色IngaN单量子阱发光二极管的合金和掺杂轮廓的现实描述来提出自我一致的模型。该模型成功地成功预测量子局限于狭窄的STRAK偏移,并且通过对压电常数的文献参数的文献参数通过分子衰减率的变化测量的电子孔重叠的相关变化。正向电流条件下发射的蓝色偏移可以归因于载体诱导模型预测的压电电荷的筛选。

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