The microstructure and dielectric properties of a solid solution (1-x)K_(0.5)Bi_(0.5)TiO_3 - xSrTiO_3 for x=0.001 ceramics

摘要

The paper presents the results of measurements of a solid solution (1-x)K_(0.5)Bi_(0.5)TiO_3 - xSrTiO3 (KBT-ST) ceramics forx=0.001 with two different sintering temperatures: (1) at temperature 1303 K for 6 hours (KBT-ST 1) and(2) at temperature 1313 K for 6 hours (KBT-ST 2). In both cases, the X-ray diffraction study demonstrated theperovskite structure with a small amount of the second phase. Microstructure research with SEM allowed to observewell-developed grains for both obtained samples. Optical studies using Raman spectroscopy showed that the obtainedsamples have a local structure consistent with the base material K_(0.5)Bi_(0.5)TiO_3 (KBT). Dielectric study of these solidsolution ceramics were taken in the temperature range from 293 K to 873 K and in the frequency range from 10 kHz to1 MHz. These measurements allowed to observe in both cases a broad maximum similar to that for the base KBTceramics. It has been observed that if the sintering temperature increase up to 1313 K it causes a double increase in thedielectric constant and the appearance of additional anomaly on the ε(T) curve at temperature approximately T_d=521 K.