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Nanofocus characterization at the Coherent X-ray Imaging instrument using 2D single grating interferometry

机译:使用2D单光栅干涉法在相干X射线成像仪器处的纳米焦特征

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In this work we present the application of a 2D single grating wavefront sensor to align and characterize the 100 nm focus at the Coherent X-ray Imaging (CXI) endstation at the Linac Coherent Light Source (LCLS). The results agree well with a model of the system, indicating that the mirrors perform as designed when alignment is optimized. In addition, a comparison with the imprint technique confirms the validity of the results, which showed that wavefront-based alignment resulted in negligible astigmatism. Analysis of the retrieved focus profile indicates that intensities >10~(21) W/cm~2 are achievable with currently available LCLS beam parameters and optimal mirror alignment.
机译:在这项工作中,我们介绍了2D单光栅波前传感器的应用以对准并在LinaC相干光源(LCLS)处的相干X射线成像(CXI)终止处的100nm聚焦。结果与系统的模型非常吻合,指示镜子在优化对准时按照设计执行。另外,与印记技术的比较证实了结果的有效性,这表明基于波前的对齐导致了可忽略的散光。检索到的焦点分析表明强度> 10〜(21)W / cm〜2可实现目前可用的LCLS光束参数和最佳镜对对齐。

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