The CCD is widely used to detect laser signal in many industrial vision and automation systems. When the chargecoupled device(CCD) is irradiated by intense laser, the image quality may decrease and reversible dazzling effectsoccur such as single pixel saturation, crosstalk, and full saturation. Understanding the laser dazzling phenomena,on the one hand, it can help to choose the suitable laser sources for the measuring systems, on the other hand, itcan optimize the designs of the CCD structures. In order to effectively utilize the dazzling effects, the lasersaturation threshold of the CCD must be known. Due to the different internal structure and working mode of CCD,the corresponding laser saturation threshold is also different. In this paper, the dazzling effects on the array CCDinduced by a 532nm wavelength pulsed laser is investigated by finite element method. A physical model isestablished base on drift-diffusion equation according to the working process of CCD and the principle of laserdazzling effects. The working state of CCD under different laser power, charge density, electron concentration andpotential curve are presented. This model is found to be useful for the analysis of laser saturation threshold.
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