Synchrotron-radiation X-ray Topography of the Rapid Grown KDP Crystals

摘要

KDP crystals were rapidly grown from point seeds by temperature reduction method. White-beam synchrotron radiation X-ray topography was used to study the growth imperfections in KDP crystals. Strong dislocation bunches originate on the prismatic faces of the seed were found. The producing reason of these dislocation bunches was discussed. Sector boundary between the prismatic sector and pyramid sector caused by the unbalance distribution of trivalent metal ions were also observed and analyzed.