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Low energy proton irradiation effects on InP/InGaAs DHBTs and InP-base frequency dividers

机译:低能量质子辐照对INP / INGAAS DHBT和INP基础分频器的影响

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InP/InGaAs DHBTs and frequency dividers are irradiated by low energy proton, and displacement damage effect of the devices are analyzed. InP/InGaAs DHBTs has been made DC characteristics measurements, and the function measurement for frequency dividers has been done both before and after proton irradiation. The breakdown voltage of InP DHBTs drop to 3.7V When the fluence up to 5×10~(13) protons/cm~2. Meanwhile, the function of frequency dividers get out of order. Degradation of DC characteristics of DHBTs are due to the radiation-induced defects in the quasi neutral base and the space charge region of base-collector and base-emitter junctions. The performance deterioration of DHBTs induce the fault of frequency dividers, and prescaler may be the most sensitive circuit.
机译:INP / InGaAs DHBT和分频器通过低能量质子照射,分析了器件的位移损伤效果。 INP / InGaAs DHBT已经进行了DC特性测量,并且在质子辐射之前和之后频率分频器的功能测量已经完成。当流量高达5×10〜(13)质子/ cm〜2时,INP DHBTS的击穿电压降至3.7V。同时,分频器的功能无序。 DC的DC特性的劣化是由于准中性基部中的辐射诱导的缺陷和基极集电极的空间电荷区域和基极 - 发射极结合。 DHBT的性能劣化诱导分频器的故障,预分频器可以是最敏感的电路。

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