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In-situ Crack Tip Stress Measurement at High Temperature in IN-617 Using Combined Nano-Indentation and Nano-Mechanical Raman Spectroscopy

机译:使用组合纳米压痕和纳米机械拉曼光谱法在-617英寸高温下的原位裂纹尖端应力测量

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In this work, the in-situ measurement of crack tip stresses in Inconel 617 at high temperature is presented. The temperature during loading in the current work was varied in the range from room temperature to 1073 K (800 °C). Three-point bending tests for in-situ notch tip stress measurements with increasing load were performed. A Combined Nano indentation and Nano mechanical Raman spectroscopy (NMRS) methods are used to measure notch tip plasticity induced stress distribution. Optical microscopy and SEM imaging is used to analyze the effect of surface finish and oxidation on the Nano indentation measurements. An in-situ Nano mechanical Raman spectroscopy is used to obtain the stress distribution at the notch tip during three point bending. The size resolution of measurements of notch-tip stresses was in the range of few microns. Temperature dependent (up to 1073 K) material properties were studied in terms of hardness and elastic modulus variation as a function of temperature. Microstructure dependent local mechanical properties were obtained using Nano indentation and is used in the finite element simulation. A finite element method based formulation to predict microstructure and temperature dependent crack tip stresses is presented and validated using the experimental stress distribution obtained from NMRS.
机译:在这项工作中,呈现了在高温下的Inconel 617中的裂缝尖端应力的原位测量。在当前工作中加载过程中的温度在室温至1073k(800℃)的范围内变化。进行三点弯曲试验,用于升高载荷的原位凹口尖端应力测量。组合的纳米压痕和纳米机械拉曼光谱(NMRS)方法用于测量凹口尖塑性诱导应力分布。光学显微镜和SEM成像用于分析表面光洁度和氧化对纳米凹口测量的影响。原位纳米机械拉曼光谱法用于在三点弯曲期间获得凹口尖端处的应力分布。 Notch-Tip应力测量的尺寸分辨率在几微米的范围内。在硬度和弹性模量变化中研究温度依赖性(最多1073 k)材料特性,作为温度的函数。使用纳米凹口获得微结构依赖性局部机械性能,并用于有限元模拟。基于有限元方法以预测微观结构和温度依赖性裂纹尖端应力的制定和验证,并使用从NMR获得的实验应力分布进行验证。

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