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Measurement of Surface Topography Using Computed Tomography

机译:使用计算机断层扫描测量表面形貌

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Computed tomography is a new field of coordinate measuring metrology. For this reason, many areas of its application are not yet completely known. The paper presents reproduction possibilities of geometrical structure of a surface by computer tomography. Results are combined with data from a classical tactile profilometer to measure surface topography. Comparison of the obtained values makes it possible to confirm the usefulness of computer tomography to reconstruct the surface geometry. This is especially important when indoor surfaces are indispensable. Such measurement with any other device than computer tomograph is not possible or requires damage of the element being measured. As a result of the measurement by means of a computer tomograph, from the same measurement data we obtain not only information about the surface and shape of the element, but also - as an additional advantage - ability to evaluate internal structure of material, for example its porosity or fibre distribution in case of composites.
机译:计算机断层扫描是一个新的坐标测量计量领域。因此,其应用的许多领域尚未完全知道。本文通过计算机断层扫描介绍了表面的几何结构的繁殖可能性。结果与来自经典触觉轮廓仪的数据相结合以测量表面形貌。所获得的值的比较使得可以确认计算机断层扫描的有用性来重建表面几何形状。当室内表面不可或缺时,这尤其重要。与计算机断层辨别仪的任何其他装置的这种测量是不可能的,或者需要损坏正在测量的元素。由于借助于计算机断层扫描仪的测量,因此我们不仅可以获得有关元件的表面和形状的信息,而且还可以是额外的优势 - 例如评估材料内部结构的能力复合材料的孔隙率或纤维分布。

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