Thin bismuth film study by means of transmission electron microscopy

摘要

Thin bismuth films were obtained by thermal evaporation in vacuum. They were studied by transmission electron microscopy. Polycrystalline structure and the prevailed orientation [001] of the film were revealed. The crystal grain sizes were in the range between 10 and 250?nm. They have mostly hexagonal shape motif in the film plane. The internal crystal lattice bending, up to 90 degrees per 1 micrometer of crystal length, was estimated through the presented analysis of extinction bend contour patterns.