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Interfacial microstructure evolution of gold alloy/Sn-based solder under different thermal aging conditions

机译:不同热老化条件下金合金/ Sn基焊料的界面微观结构演变

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Sn-based solder is used for soldering a gold alloy and a brass sheet.Subsequently thermal aging tests are performed.The influence of thermal aging on the interfacial microstructure evolution of gold alloy/Sn-based solder and its mechanical properties was analysed.The results show that the aging time and aging temperature have large influence on the growth of interfacial compounds,and the interfacial compounds show a multiply-sublayers structure,the main components are AuNi2Sn4,AUS114,Ni3Sn4 and N^Sn.The hardness of the interfacial compounds show a distinct layered phenomenon,in which the hardness of the first layer is the highest.Shear tests indicated that the failure happened at the gold alloy/Sn-based solder interface close to the gold alloy,showing obvious brittle fracture features.Shear strength decreases with increasing aging time at the aging temperature of 150°C and 175°C.
机译:SN基焊料用于焊接金合金,黄铜板。进行热老化试验。分析了热老化对金合金/ Sn基焊料的界面微观结构演化的影响及其机械性能。结果表明,老化时间和老化温度对界面化合物的生长具有很大影响,并且界面化合物显示倍增子层结构,主要成分是AUNI2SN4,AUS114,Ni3SN4和N ^ Sn。界面化合物的硬度显示一种不同的分层现象,其中第一层的硬度是最高的。表明测试表明,靠近金合金的金合金/ Sn的焊料界面发生故障,显示出明显的脆性骨折特征.Shear强度随在150℃和175℃的老化温度下增加老化时间。

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