AFM based Topography Characterization of Smooth, Nanotextured, and Microtextured Surfaces

摘要

Surface topography is important to the function of many kinds of industrial products and is constantly growing with the increase advancement of technology. It is important to understand surface topography measurement and how to control it effectively. Surface roughness is an important parameter of topography characterization and is quantified by the vertical deviations of a real surface from its ideal form. Therefore, depending on the application it may be desirable to have either a rough surface or a very smooth surface. Rough surfaces can be desirable for cell adhesion and plays a great role in biological or biomedical application. Smooth surfaces can be desirable in applications where there are two interacting surfaces and minimal wear between the two is needed. This work addresses the surface topography characterizing of a smooth, nanotextured, and microtextured surface.