Case studies highlighting how measuring technology can be used to identify the root causes of gauge variation: · EXAMPLE 1: Mechanical Profiling Gauge or Capacitance Gauge with Segment or Quadrant Analysis for minimizing (total thickness) gauge variation to prevent converting issues · EXAMPLE 2: Capacitance Gauge with Fourier Analysis for (a) high-side, low-side gauge offset in blown film and (b) embedded high frequency over low frequency variation (total thickness) in extrusion coated films · EXAMPLE 3: Interferometer Gauge using Light Refraction for determining profile of (a) thin barrier (layer) thickness in coextruded films and for (b) machine-direction barrier layer drop-out in film extrusion
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