Failure analysis on false call probe pins of microprocessor test equipment

摘要

A study has been conducted to investigate failure analysis on probe pins of test modules for microprocessor. The 'health condition' of the probe pin is determined by the resistance value. A test module of 5V power supplied from Arduino UNO with "Four-wire Ohm measurement" method is implemented in this study to measure the resistance of the probe pins of a microprocessor. The probe pins from a scrapped computer motherboard is used as the test sample in this study. The functionality of the test module was validated with the pre-measurement experiment via VEE Pro software. Lastly, the experimental work have demonstrated that the implemented test module have the capability to identify the probe pin's 'health condition' based on the measured resistance value.