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Crystal Orientation and Electrical Properties of Tin Oxide Transparent Conducting Films Deposited on Rutile Surface

机译:金红石表面沉积氧化锡透明电导膜的晶体取向和电性能

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Thin films of tin oxide (SnO2) without doping are attractive transparent conducting film since environmentally unfavorable elements of antimony or fluorine are eliminated. Tin oxide films without doping were fabricated very cheaply on (001) and (100) planes of single crystal of rutile (TiO2) by spray chemical vapor deposition (mist CVD). The film deposited on rutile (001) surface was poorly epitaxial (double domain) but with higher mobility (24 cm~2 V~(-1) s~(-1)) and lower resistivity (1.6xl0~3 Ω cm) than that deposited on glass substrate (16 cm~2 V~(-1) s~(-1) and 2.4x10~(-3) Ω. cm) for reference. Deposition on rutile (100) surface resulted in better epitaxial growth (single domain). The mobility (39 cm~2 V~(-1) s~(-1)) and the carrier electron density (2.7x10~(20) cm~(-3)) were much higher. The resistivity (6.2x 10~(-4) Ω cm) was compatible with those doped with antimony or fluorine and will be the lowest among tin oxide films without doping.
机译:氧化锡(SnO2)的薄膜而无需掺杂是有吸引力的透明导电膜,因为未达到锑或氟的环保元素。通过喷涂化学气相沉积(MIST CVD),对不掺杂的氧化锡和(100)单晶(TiO 2)的(100)平面非常便宜地制造。沉积在金红石(001)表面上的薄膜是外延(双结构域),但迁移率较高(24cm〜2 V〜(-1)S〜(-1)),电阻率降低(1.6×10〜3Ωcm)沉积在玻璃基板上(16cm〜2 V〜(-1)S〜(-1)和2.4×10〜(-3)Ω.CM)以供参考。在金红石(100)表面上沉积导致更好的外延生长(单结构域)。迁移率(39cm〜2V〜(-1)S〜(-1))和载体电子密度(2.7×10〜(20)cm〜(-3))要高得多。电阻率(6.2×10〜(-4)Ωcm)与掺杂锑或氟的那些兼容,并且在没有掺杂的情况下是氧化锡膜中最低的。

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